Herr, Sandy: search on Z-Library

The world's largest scientific articles store. 70,000,000+ articles for free.

Don't use scam websites

1

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Metrology, Inspection, and Process Control for Microlithography XVII - Accuracy in CD-SEM metrology

Nikitin, Arkady V., Sicignano, Albert, Yeremin, Dmitriy Y., Sandy, Matthew, Goldburt, E. Tim, Herr, Daniel J.

Year:

2003

Language:

english

File:

PDF, 1.75 MB

english, 2003

2

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Metrology, Inspection, and Process Control for Microlithography XVII - Designing a reference for CD-SEM magnification calibration

Sicignano, Albert, Nikitin, Arkady V., Yeremin, Dmitriy Y., Sandy, Matthew, Goldburt, E. Tim, Herr, Daniel J.

Year:

2003

Language:

english

File:

PDF, 1.85 MB

english, 2003

3

PARK2 and PACRG are commonly downregulated in clear-cell renal cell carcinoma and are associated with aggressive disease and poor clinical outcome

Toma, Marieta I., Wuttig, Daniela, Kaiser, Sandy, Herr, Alexander, Weber, Thomas, Zastrow, Stefan, Koch, Rainer, Meinhardt, Matthias, Baretton, Gustavo B., Wirth, Manfred P., Fuessel, Susanne

Journal:

Genes, Chromosomes and Cancer

Year:

2013

Language:

english

File:

PDF, 675 KB

english, 2013

4

SPIE Proceedings [SPIE SPIE's 27th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 3 March 2002)] Metrology, Inspection, and Process Control for Microlithography XVI - Matching and monitoring a CD-SEM tool cluster

Sicignano, Albert, Herr, Daniel J. C., Nikitin, Arkady V., Yeremin, Dmitriy Y., Sandy, Matthew, Goldburt, E. T.

Year:

2002

Language:

english

File:

PDF, 181 KB

english, 2002

5

Book Reviews

Herr, Monty, Sandy, Alan J.

Journal:

Year:

1994

File:

PDF, 325 KB

1994

6

SPIE Proceedings [SPIE Microlithography 2003 - Santa Clara, CA (Sunday 23 February 2003)] Metrology, Inspection, and Process Control for Microlithography XVII - Quantifying drift in SEM

Sicignano, Albert, Yeremin, Dmitriy Y., Sandy, Matthew, Goldburt, E. T., Herr, Daniel J.

Year:

2003

Language:

english

File:

PDF, 836 KB

english, 2003

7

Who's Watching the Children? Caregiver Features Associated with Physical Child Abuse versus Accidental Injury

Fingarson, Amanda K., Pierce, Mary Clyde, Lorenz, Douglas J., Kaczor, Kim, Bennett, Berkeley, Berger, Rachel, Currie, Melissa, Herr, Sandy, Hickey, Sheila, Magana, Julia, Makoroff, Kathi, Williams, Ma

Journal:

The Journal of Pediatrics

Year:

2019

Language:

english

File:

PDF, 466 KB

english, 2019

8

SPIE Proceedings [SPIE SPIE's 27th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 3 March 2002)] Metrology, Inspection, and Process Control for Microlithography XVI - Factors influencing CD-SEM metrology

Sicignano, Albert, Nikitin, Arkady V., Yeremin, Dmitriy Y., Sandy, Matthew, Goldburt, E. T., Herr, Daniel J. C.

Year:

2002

Language:

english

File:

PDF, 784 KB

english, 2002

To build up a library is to create a life. It’s never just a random collection of books.

— Carlos María Domínguez

Official channel

Z-Library Desktop Launcher

Z-Library Since 2009 support@z-lib.do

EnglishРусскийEspañolItalianoελληνικάاللغة العربيةBahasa IndonesiaBahasa Malaysiaहिन्दीDeutschFrançaisPortuguêsУкраїнськаPolski中文繁體中文日本語Tiếng ViệtAzərbaycan DiliՀայոց լեզուภาษาไทยTürk Diliქართველიবাংলাپښتوతెలుగుاردو한국어SrpskiБългарски